This issue of Microscopy and Microanalysis contains
contributions presented at the Frontiers of Electron Microscopy in
Materials Science (FEMMS) meeting held in Kasteel Vaalsbroek, The
Netherlands, on September 25–30, 2005. Tenth in the series of
biennial conferences, the meeting focused on the latest developments in
the field of advanced instrumentation and application of electron
microscopy in materials science. The international character of this
series of conferences was once again emphasized by the presence of over
140 delegates whose interests include academia, national laboratories, and
industry from 16 countries representing all areas of the globe.